Back to results
US 6,211,688 B1Granted
Test area with automatic positioning of a microprobe and a method of producing such a test area
AssigneeSTMicroelectronics S.r.l.
InventorMichel Vallet
Life of this patent
Estimating the term…
Abstract
The invention relates to a test area of an electronic circuit comprising a contact point formed in the surface of a substrate. The test area also includes spaced apart radially extending bosses adjacent the contact point for guiding a test probe positioned on the surface of the substrate to the contact point.
Claims24
A test area for an electronic circuit, comprising:
- a substrate;
- a contact point on a surface of the substrate;
- and
- at least one elongated boss on the surface of the substrate in proximity to the contact point, and being oriented towards the contact point for guiding a test probe positioned on the surface of the substrate towards said contact point.
1 more element
An electronic circuit comprising:
- a substrate;
- and
- at least one test area on said substrate and comprising:
- a contact point formed on a surface of the substrate;
- and
- at least one boss adjacent to the contact point for guiding a test probe positioned on the surface of the substrate towards said contact point.
3 more elements
A method for producing a test area on a surface of a substrate of an electronic circuit, comprising the steps of:
- forming on the surface of the substrate a layer of electrically conducting material in electrical contact with the electronic circuit;
- shaping the layer of electrically conducting material for defining a contact point in electrical contact with the electronic circuit;
- forming a plurality of elongated bosses surrounding the contact point which extend radially towards the contact point;
- forming an insulating layer covering the layer of shaped electrically conducting material;
- and
- opening an access window to the contact point in the insulating layer.
3 more elements
A method for producing a test area on a surface of a substrate of an electronic circuit, comprising the steps of:
- forming a contact point on a surface of the substrate;
- forming at least one boss on the surface of the substrate in proximity to the contact point, and being oriented towards the contact point;
- and
- providing means for guiding a test probe positioned on the surface of the substrate towards the contact point.
1 more element
Dependencies are inferred from the claim text.