US 6,211,513 B1 · Automated test system and method for device having circuit and ground connections

Abstract

An automated test system for testing a device includes a processor, a test apparatus, and a barrier circuit. The processor is operable to generate a control signal, said control signal including test parameters. The test apparatus comprises a first connection operable to be connected to a circuit connection of the device, a second connection operable to be connected to a ground connection of the device, and a third connection operable to be connected to a chassis of the device. The test apparatus is further operably connected to receive the control signal from the processor. The test apparatus is operable to perform a first test on the device based on the test parameters. The barrier circuit is operable to detect movement in the vicinity of the device. The barrier circuit is operably connected to cause the test apparatus to stop performing a first test on the device upon detection of movement in the vicinity of the device.

Claims20

Dependent claims

A method of disabling operation of a test apparatus responsive to motion in proximity to a first location, wherein the operation of the test apparatus causes hazardous conditions in the first location, the method comprising:

a) forming an optical perimeter around the first location;
b) causing operation of the test apparatus under the control of a processor, the test apparatus at least partially creating a hazardous condition in the first location by applying a voltage exceeding 1000 volts to a device located within the first location;
c) detecting movement of an object through the optical perimeter;
d) providing a detection signal to a control device upon detection of movement of an object through the optical perimeter;
and
e) causing the test apparatus to stop operating responsive to the control device receiving the detection signal by removing the voltage from the device.

3 more elements

An automated test system for testing a device, the device having a circuit connection, a ground connection and a chassis, the automated test system comprising:

a processor operable to generate a control signal, said control signal including test parameters;
a test apparatus comprising a first connection operable to be connected to the circuit connection of the device, a second connection operable to be connected to the ground connection of the device, and a third connection operable to be connected to the chassis of the device, the test apparatus further operably connected to receive the control signal from the processor, the test apparatus operable to perform a first test on the device based on the test parameters;
a barrier circuit operable to detect movement in the vicinity of the device, the barrier circuit operably connected to cause the test apparatus to stop performing a first test on the device upon detection of movement in the vicinity of the device.

Dependencies are inferred from the claim text.

Automated test system and method for device having circuit and ground connections

Life of this patent

Automated test system and method for device having circuit and ground connections

Life of this patent

Abstract

Claims20