Method and apparatus for clearing ions in a scanning electron beam computed tomographic system using a single potential power source
AssigneeImatron, Inc.
InventorsRoy E. Rand, Khem Garewal, James F. Heilman
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AssigneeImatron, Inc.
InventorsRoy E. Rand, Khem Garewal, James F. Heilman
Estimating the term…
In a scanning electron beam CT system, a positive ion clearing electrode system is disposed within the CT system solenoid coil, and is operated from a single power source. Mounted coaxially about the electron beam, preferably the electrode system includes three sections, each having two electrode elements, one element being coupled to about −800 V to about −2 kV and the other element being grounded. Within the electrode system, the ratio between element diameter and electron beam diameter is substantially constant. Preferably elements are helically twisted about the beam axis. The electrode configuration cancels net quadrupole (focusing) and octopole (aberration-producing) fields. In the presence of electric discharge, essentially zero electron beam displacement and deflections occurs, and changes in focusing strength remain zero.
A single potential ion clearing electrode system useable with an electron beam computed tomographic scanning system including a solenoid coil coaxially mounted about an axis of said scanning system, the electrode system positioned substantially within said solenoid coil and comprising:
A single potential ion clearing electrode system useable with an electron beam computed tomographic scanning system including a solenoid coil coaxially mounted about an axis of said scanning system, the electrode system comprising:
A method of extracting positive ions from an electron beam generated by a computed tomographic scanning system that has a solenoid coil coaxially mounted about an axis of said scanning system, while ensuring safe focusing regimes, the method comprising the following steps:
Dependencies are inferred from the claim text.