Partial replacement of partially defective memory devices
AssigneeMicron Technology, Inc.
InventorJohn O. Jacobson
Life of this patent
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Abstract
The partial replacement of partially defective integrated circuit devices, such as memory devices, is disclosed. In one embodiment, the data lines coupled to different sections of the memory array of a memory device have inserted in series therein normally closed links. If a section is found to be defective, then the link for the data line coupled to the section is opened. This permits a repair device to be coupled to the memory device such that only the defective section is replaced. The address and control lines of the repair device are coupled to their counterpart lines of the memory device. However, a data line of the repair device is coupled to a data line of the memory device only if the data line of the memory device is coupled to a defective section.
Claims24
A memory system comprising:
- a bus;
- a memory device having a plurality of memory sections, each of the memory sections connected to the bus via a data line, each data line having a normally closed link, wherein the link is opened to disconnect a memory section from the bus when the memory section is defective;
- and
- a repair site to receive a repair device when the memory device has a defective memory section, the repair device including at least one repair section, wherein the repair section connects to the bus to replace the defective memory section.
A memory system comprising:
- a substrate
- a memory device located on the substrate, the memory device including a plurality of memory sections;
- and
- a repair site located on the same substrate;
- wherein the repair site receives a repair device when at least one of the memory sections is defective, wherein the repair device replaces only a defective section of the memory device, wherein the repair device is partially operational.
A memory system comprising:
- a substrate
- a memory device located on the substrate, the memory device including at least one defective section;
- and
- a repair site located on the same substrate;
- the repair site including a repair device mounted thereon to replace the defective memory section, wherein a functionality of the defective section is performed by the repair device, wherein a functionality of a non-defective memory section is performed by the memory device.
A multi-chip module comprising:
- a substrate;
- a plurality of memory devices located one the substrate, each of the memory devices having a plurality of memory sections, each memory section connecting to a data line, each data line having a normally closed link, wherein at least one of the memory device has a defective memory section, wherein a link connected to the defective memory section is opened to prevent communications to and from the defective memory section;
- and
- a plurality of repair sites located on the same substrate, at least one of the repair site having a repair device mounted on the repair site, wherein the repair device operates to replace only the defective memory section.
A multi-chip module comprising:
- a substrate;
- a plurality of memory devices located on the substrate, at least one memory device being a partially defective memory device;
- and
- a plurality of repair sites located on the same substrate, the repair site having at least one repair device mounted on one of the repair site to replace the partially defective memory device.
A method of repairing a partially defective memory device, the method comprising:
- identifying a defective section of the memory device;
- mounting a repair device on a repair site located near the memory device;
- opening a link of connected between the defective section and a bus;
- connecting corresponding control lines and address lines of the memory device and the repair device to enable both devices to receive the same command from the bus;
- and
- connecting a repair data line from the repair device to the bus to enable a section of the repair device to replace only the defective section of the memory device.
Dependencies are inferred from the claim text.