Internal clock jitter detector
AssigneeIntel Corporation
InventorsKeng L. Wong, Gregory F. Taylor, Ravishankar Kuppuswamy, Douglas R. Parker, Hung-Piao Ma, Kent R. Callahan, Xia Dai
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AssigneeIntel Corporation
InventorsKeng L. Wong, Gregory F. Taylor, Ravishankar Kuppuswamy, Douglas R. Parker, Hung-Piao Ma, Kent R. Callahan, Xia Dai
Estimating the term…
An apparatus and method for detecting and measuring internal clock jitter is disclosed. In one embodiment, a reference clock generator generates a reference clock signal based on an instantaneous clock signal. The reference clock signal includes the instantaneous clock signal delayed for an average duration. A phase comparing element receives both the instantaneous clock signal and the reference clock signal such that the phase comparing element measures a phase difference between the instantaneous clock signal and the reference clock signal. The magnitude and direction of the phase difference is indicated by one of a number of distinct phase difference bins in the phase comparing element.
A circuit comprising:
A circuit comprising:
A circuit comprising:
A method for detecting error in a clock signal, the method comprising the steps of:
A method comprising the steps of:
Dependencies are inferred from the claim text.