Method for testing semiconductor components

A method for testing a semiconductor component comprising:

• providing a test apparatus in electrical communication with test circuitry;
• providing a carrier comprising a base including first contacts, and an interconnect on the base comprising contact members in electrical communication with the first contacts and configured to make temporary electrical connections with second contacts on the component;
• providing a socket on the test apparatus comprising electrical connectors in electrical communication with the test circuitry and configured to electrically engage the first contacts, and a camming member configured to manipulate the electrical connectors to permit insertion of the base into the socket;
• placing the component on the base with the second contacts in electrical communication with the contact members;
• placing the base in the socket while depressing the camming member to place the first contacts in electrical communication with the electrical connectors;
• and
• applying test signals through the electrical connectors, the first contacts, the contact members and the second contacts to the component.