Semiconductor device and method for fabricating the same
AssigneeFujitsu Limited
InventorOsamu Tsuboi
Life of this patent
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AssigneeFujitsu Limited
InventorOsamu Tsuboi
Estimating the term…
The semiconductor device comprises a base substrate, a wiring 54 formed on the base substrate, a first insulating film 48, 56 for covering the upper surface and the side surfaces of the wiring 54, an etching stopper film 58 formed on the base substrate and the first insulating film 48, 56, a conductor plug 36b connected to the base substrate through the etching stopper film 58 and projected upper of the base substrate, and a capacitor 79 having one electrode 68 connected to the upper surface and the side surfaces of the conductor plug 36b. The electrode 68 is formed not only on the upper surface of the conductor plug 36b but also on the side walls thereof, whereby the electrode 68 can be fixed to the conductor plug 36b without failure. The electrode 68 is formed not only on the upper surface of the conductor plug 36b but also on the side surfaces thereof in the vicinity of the conductor plug 36b, whereby the electrode 68 can have a large surface area in the vicinity of the side surfaces of the conductor plug 36b. This enables the electrode 68 to be reduced in height.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.