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US 6,205,852 B1Granted
Method and apparatus for testing of sheet material
AssigneeLehighton Electronics, Inc.
InventorAustin R. Blew
Life of this patent
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AssigneeLehighton Electronics, Inc.
InventorAustin R. Blew
Estimating the term…
An apparatus for testing of electrical, mechanical, physical and/or chemical properties of material in sheet form includes sensors which may be positioned adjacent to a surface of material in sheet form located in a cassette and supports positioned to reduce sag of the material. A method for testing sheet material includes the steps of placing the sheet material in a cassette, and testing the sheet material while in the cassette. A cassette includes shelves having defined therein test heads for testing properties of material in sheet form. Shelves may have test heads or sensors mounted in a lower surface thereof, which test heads or sensors cooperate with test heads or sensors mounted in the upper surface of the next lower shelf. Shelves may include test points that have multiple sensors that cooperate, such as by inductive coupling, to test the material. A robot end effector is dimensioned to contact a lower surface of material in a cassette and has test sensors defined therein for testing of properties of the material. Materials to be tested include flat panels for computer screens and semiconductor wafers.
Apparatus for testing of material in sheet form, comprising:
Method for measuring sheet resistance of a sheet material, comprising the steps of placing the sheet material in a cassette on an insulating, rigid substrate having a planar top surface, emloying a plurality of sensors, in the form of compact test heads recessed in said substrate below said top surface and arranged in an array corresponding to a substantial portion of the surface of the material, to emit radiation and detect eddy currents to measure sheet resistance of the sheet material while in the cassette.
Cassette for sheets of material, said cassette comprising side walls and shelves rigidly supported on said side walls, said shelves being of an electrically-insulating material having generally planar and horizontal upper surfaces, and sensors in the form of compact test heads recessed in said shelves below said upper surfaces and arranged in arrays corresponding to a substantial portion of the surface of the material, said test heads being adapted to employ eddy curents to measure sheet resistance positioned on said upper surfaces.
Apparatus for testing of sheet material, comprising:
Method for testing silicon wafers and flat panels for flat panel displays, comprising the steps of placing the silicon wafer or flat panel display in a cassette on an insulating, rigid substrate having a planar top surface, employing a plurality of sensors, in the form of compact test heads recessed in said substrate below said top surface and arranged in an array corresponding to a substantial portion of the surface of the material, to emit microwave radiation and detect microwave radiation, in order to test the wafer or panel while in the cassette.
Cassette for sheets of material, said cassette comprising side walls and shelves rigidly supported on said side walls, said shelves being of an electrically-insulating material having generally planar and horizontal upper surfaces, and sensors in the form of compact test heads recessed in said shelves below said upper surfaces and arranged in arrays corresponding to a substantial portion of the surface of the material, said test heads being adapted to emit microwave radiation and receive microwave radiation.
Dependencies are inferred from the claim text.