US 6,205,515 B1Granted

Column redundancy circuitry with reduced time delay

AssigneeWinbond Electronic Corp.

InventorEddy C. Huang

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Abstract

A system and method of implementing column redundancy in a memory system in which a single set of redundant columns is provided in one of a plurality of blocks of columns which is the fastest to receive decoded select signals or which is physically located closest to decode circuitry. In normal operation, the decode circuitry selects a single column and block as determined by the input address signal. In redundancy mode, the input address is compared to a pre-programmed repair column and block address corresponding to the a previously determined defective column and a match signal is generated. The match signal functions to enable the block having the redundant columns and disable the sense amplifiers of all other blocks. In addition, the match signal disables all of the columns in the selected redundancy block other than a single redundant column. As a result, all redundant columns have approximately the same access time as the fastest block of columns in the memory system. In addition since, redundant columns are not included in each block of columns, a reduced number of redundant columns are used and silicon space is conserved.

Claims4

Dependent claims

A method of accessing a memory array including a plurality of blocks of columns each block sensing data independently, wherein said each block has an associated accessing address and each column has an associated accessing address, and wherein each of said plurality of blocks has an associated access time factor relating to its relative position in said memory array which determines the speed at which select signal are made available to said each block, said method comprising the steps of:

including in one of said plurality of blocks a set of redundant columns, wherein said one block has the fastest access time factor than any other of said plurality of blocks;
accessing said array with non-defective column input addresses each having an associated decoded block select address and a decoded column select address wherein data is accessed from said array at said non-defective input address associated decoded block and column select addresses;
accessing said array with defective column input addresses each having an associated decoded block select address and column select address wherein data is accessed from one of said set of redundant columns in said one block instead of said defective column input addresses' associated decoded block and column select address;
and
wherein said step of accessing with said array with said defective column input addresses and said step of accessing said array with said non-defective column input addresses comprises the steps of comparing one of said defective column and non-defective column input addresses to at least one pre-programmed repair block and column address to generate a match signal, said match signal having a first state indicating that no match exists and a second state indicating a match exists.

2 more elements

A memory system comprising:

a memory array including a plurality of blocks of columns of memory cells for storing data, each block having an associated block select address for enabling data sensing in said each block and each column having an associated column select address for accessing said each column, wherein each of said plurality of blocks has an associated access time factor relating to its relative position in said memory array which determines the speed at which data is available from said each block;
a set of redundant columns residing in one of said blocks, wherein said one block has the fastest access time factor;
means for comparing said input signal having a corresponding non-defective decoded column select address and non-defective decoded block select address to at least one pre-programmed repair column select address and block select address corresponding to a defective column and generating at least one signal indicating whether a match has occurred;
a means for accessing said array with said input address such that data is accessed from said non-defective decoded column select address and non-defective decoded block select address when said match signal is in a first state and said input address does not match said pre-programmed column and block select addresses;
means for disabling sensing of data from all blocks except said one block in response to said at least one match signal in a second state and said input signal matches said pre-programmed address;
means for enabling sensing of data from said one block in response to said at least one match signal in said second state;
means for deselecting all columns in said one block except for said set of redundant blocks in response to said at least one match signal in said second state;
and
means for selecting one of said set of redundant columns for sensing data in response to said at least one match signal in said second state.

6 more elements

Dependencies are inferred from the claim text.