System and method for generating test program code simultaneously with data produced by ATPG or simulation pattern capture program

A method for automatically converting source test data for a designed electronic device into a test program compatible with a selected target ATE platform for testing the designed electronic device, the method comprising:

• inputting setup control parameters to select the target ATE platform,
• streaming units of the source test data into the translator,
• transforming the source test data into test code conforming to the setup control parameters,
• outputting the test code to an ATE test program file, the test program file operable on the selected target ATE platform.

A translator operable on a computer to translate source test data into test code operable on a target ATE platform, the translator comprising:

• means for receiving a unit of source test data at a time,
• means for reading a file, the file comprising setup control parameters, the setup control parameters including a selection of the target ATE platform,
• means for transforming the source test data to test code in accordance with the setup control parameters,
• means for outputting the test code to a test program, the test program operable on the target ATE platform.

A system for automatically converting source test data for a designed electronic device into a plurality of test programs, each test program compatible with a selected test program format, the system comprising:

• a plurality of translators,
• means for inputting source test data into the translators,
• a setup control mechanism for inputting setup control parameters, the setup control parameters including the selection of at least one of a plurality of test program formats,
• each translator including:
• a means for transforming the source test data into test code conforming to the setup control parameters;
• and
• a means for outputting the test code to a test program formatted in a selected one of the test program formats.