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US 6,205,096 B1Granted
Method for testing quality of an optical disk medium
AssigneeLG Electronics Inc.
InventorsWoon-Seong Yeo, Hyung-Kyu Kim
Life of this patent
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Abstract
The method and apparatus for testing the quality of an optical disk medium records test data in the outer area of an optical disk. This outer area of the optical disk is not used when manufacturing a prerecorded disk, and is also not used by users of write-once optical disks. The quality of the optical disk is judged based on the test signal produced from reproducing the test data in the outer area of the optical disk.
Claims2
A method for testing quality of an optical disk medium, comprising:
- first selecting one of a sequential, periodic and portion reproduction mode;
- reproducing test data in an outer area of said optical disk medium based on said selected reproduction mode to produce a test signal, said test data being reproduced sequentially when said sequential reproduction mode is selected, portions of said test data being reproduced at a periodic interval when said periodic reproduction mode is selected, at least one portion of said test data being reproduced in said portion reproduction mode, and said outer area of said optical disk medium being located circumferentially outside of a main information storage area;
- second selecting a threshold value depending upon said selected reproduction mode;
- and
- judging quality of said optical disk medium based on said reproduced test signal and said selected threshold value.
2 more elements
Dependencies are inferred from the claim text.