Temperature-compensated bias generator
AssigneeAdvanced Micro Devices, Inc.
InventorsMichael A. Van Buskirk, Bhimachar Venkatesh
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Abstract
The present invention discloses methods and systems for generating a bias voltage during an Automatic Program Disturb Erase Verify (APDEV) operation in a memory device. During the APDEV operation, a predetermined supply voltage is generated by a regulated power supply. The predetermined supply voltage is directed to a temperature-compensated bias generator circuit. The temperature-compensated bias generator circuit is activated to generate the bias voltage based on the operating temperature of the memory device.
Claims27
A temperature-compensated bias generator circuit for generating a bias voltage during an APDEV operation in a memory device, comprising:
- a wordline enable circuit;
- and
- a temperature adjustment circuit electrically connected with said wordline enable circuit, wherein said temperature adjustment circuit is activated by said wordline enable circuit to generate said bias voltage.
A temperature-compensated bias generator circuit for generating a bias voltage during an APDEV operation in a memory device, comprising:
- a temperature adjustment circuit, wherein said temperature adjustment circuit is supplied a predetermined supply voltage;
- a wordline enable circuit electrically connected with said temperature adjustment circuit wherein said wordline enable circuit activates said temperature adjustment circuit to generate said bias voltage;
- and
- a resistor chain located within said temperature adjustment circuit for controlling said predetermined supply voltage to generate said bias voltage based on an operating temperature of said memory device.
A method of generating a bias voltage during an APDEV operation in a memory device, comprising the steps of:
- generating a predetermined supply voltage with a regulated power supply;
- directing said predetermined supply voltage to a temperature adjustment circuit;
- activating said temperature adjustment circuit with a wordline enable circuit;
- and
- generating said bias voltage with said predetermined supply voltage and a resistor chain located within said temperature adjustment circuit.
Dependencies are inferred from the claim text.