Semiconductor memory device having redundancy memory circuit
AssigneeNEC Corporation
InventorTadahiko Sugibayashi
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AssigneeNEC Corporation
InventorTadahiko Sugibayashi
Estimating the term…
A semiconductor memory device has: a memory cell array for relief 201 which stores tag (TAG) information written from a nonvolatile memory 200 for identifying defective bit cells in the basic memory 110, 110b and provides a plurality of memory cells (data) for replacing the defective bit cells in bits; an address converter 203 for allocating external addresses to an index portion and a tag portion; a decoder 202 for decoding the index portion and outputting a word line signal to the memory cell array 201; a comparator 204 for comparing the allocated tag portion with the tag information inside the memory cell array 201 specified by an output word line signal of the decoder 202; and a selector 205 for selecting and connecting either of memory cells in the basic memory 110, 110b and memory cells in the memory cell array 201 with the outside on the basis of a hit flag outputted from the comparator 204.
A semiconductor memory device comprising:
A semiconductor memory system comprising:
Dependencies are inferred from the claim text.