Display device having defect inspection circuit
AssigneeSeiko Instruments Inc.
InventorsTsuneo Yamazaki, Kunihiro Takahashi, Hiroaki Takasu, Atsushi Sakurai
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AssigneeSeiko Instruments Inc.
InventorsTsuneo Yamazaki, Kunihiro Takahashi, Hiroaki Takasu, Atsushi Sakurai
Estimating the term…
A dense display may be provided with an internal defect detection circuit to enhance production yield. A plurality of pixels, each including thin film transistors and liquid crystal cells driven by driving electrodes, are arranged in a matrix form and scanned by a plurality of control signal lines and a plurality of image signal lines. A control signal line driving circuit is formed of shift registers having one bit per signal line, and sample-and-hold circuits. An inspection circuit is provided with plural switching elements, each having a first terminal connected to a respective image signal line, a second terminal connected to an inspection output line and a third terminal receptive of an inspection control input signal for controlling an electrical connection between the first and second terminals. In accordance with this configuration, inspection of individual signal lines may be achieved and the inspection control input signal may be internally or externally generated. Moreover, similar detection circuitry may be used to detect defects in the control signal lines and, in this manner, defects may be located to the individual pixel level.
A display device having a driving substrate, a counter substrate and an electro-optic material arranged between the driving substrate and the counter substrate, wherein the driving substrate comprises:
A display device having a driving substrate, a counter substrate and an electrooptic material arranged between the driving substrate and the counter substrate, wherein the driving substrate comprises;
Dependencies are inferred from the claim text.