Testing apparatus for testing a ball grid array device
AssigneeSilicon Integrated Systems Corp.
InventorsYi-Chang Hsieh, Lai-Fue Hsieh, Mu-Sheng Liao
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AssigneeSilicon Integrated Systems Corp.
InventorsYi-Chang Hsieh, Lai-Fue Hsieh, Mu-Sheng Liao
Estimating the term…
A testing apparatus for testing a ball grid array (BGA) device, includes a movable carrier which has a top face recessed to form a cavity of square shape to receive the BGA device. A centering member is disposed at a center part of a cavity bottom face of the cavity to center a squarely looped array of voltage source solder balls formed at a bottom face of the BGA device, relative to the center part of the cavity bottom face. The centering member projects upward from the cavity bottom face to engage and prevent positional deviation of the squarely looped array of the voltage source solder balls when the BGA device is seated on the cavity bottom face. The testing apparatus further includes a testing circuit unit, a surface mount matrix disposed on top of the testing circuit unit, and a hollow frame member mounted on top of the surface mount matrix. The frame member has a square central opening to expose the surface mount matrix, and the surface mount matrix can make a direct electrical contact with the BGA device when the latter is placed in the central opening.
A testing apparatus for testing a ball grid array (BGA) device, the device having a bottom face formed with a plurality of signal solder balls, a plurality of ground solder balls, and a plurality of voltage source solder balls, the voltage source solder balls being arranged in a squarely looped array at a central portion of the bottom face of the BGA device, the ground solder balls being arranged in rows within the squarely looped array and being spaced apart from the voltage source solder balls, said testing apparatus comprising:
Dependencies are inferred from the claim text.