Device for inserting at least one semiconductor component into a receptacle

A method of protecting a semiconductor component during a test which comprises inserting at least one semiconductor component into a receiving portion of a device, particularly into a test socket for testing the electric function of the semiconductor component, said device comprising:

• (i) at least one receiving space (46) for the semiconductor component (12), said receiving space (46) comprising a receiving opening (56),
• (ii) at least one pushing element (34);
• (b) pushing the semiconductor component (12) in a pushing direction (58) through said receiving opening (56) into said receiving space (46), wherein said pushing element (34) further comprises a gas cushion generating means (62);
• and
• (iii) generating a gas cushion (60) for centering the semiconductor component (12) within said receiving opening (56) and subsequently pushing the semiconductor component (12) into said receiving space (46), whereby said semiconductor component is safely positioned for testing without undue wear or damage to said component.