A control method for use with a crystal puller for growing a monocrystalline semiconductor crystal according to the Czochralski process, said crystal puller having a heated crucible containing a semiconductor melt from which the crystal is grown, said crystal being grown on a seed crystal pulled from the melt, said method comprising the steps of:
- pulling the growing crystal from the melt at a first target pull rate, said first target pull rate substantially following an initial velocity profile for growing a taper portion of the crystal, said taper portion of the crystal having a generally increasing diameter;
- measuring the crystal diameter during the taper portion of growth;
- estimating a slope of the crystal diameter, said estimated slope being a function of a change in crystal diameter relative to time during the taper portion of growth and the first target pull rate;
- predicting a crystal diameter measurement Di at which to initiate shouldering for growing a body portion of the crystal from the taper portion of the crystal, said shouldering initiation diameter measurement Di being a function of the estimated slope, said body portion of the crystal having a substantially uniform diameter greater than the predicted diameter measurement Di;
- and
- increasing the pull rate to a second target pull rate when the measured crystal diameter reaches the shouldering initiation diameter measurement Di for controlling a transition from the taper portion of the crystal to the body portion of the crystal, said second target pull rate corresponding to initial growth of the body portion of the crystal.