US 6,200,022 B1 · Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy

Abstract

A system and method for performing localized mechanothermal analysis with scanning probe microscopy (“MASM”) is disclosed. In a preferred embodiment an image of the surface or subsurface of a sample is created. A localized region of the sample is selected from the image. Using a scanning microscope, an active or passive thermal probe is positioned at the selected region. A temperature ramp is applied to the localized region. In addition, a dynamic or modulated stress or strain is applied to the localized region. Force data resulting from the applied temperature and stress or strain is collected and processed to produce a graph or fingerprint of the dynamic mechanical and/or calorimetric properties of the selected localized region.

Claims20

Dependent claims

A system for performing localized thermomechanical experiments on a sample, comprising:

a scanning microscope;
a computer coupled to said scanning microscope, said computer comprising;
a video display device on which an image of the surface of the sample is displayed;
and
a selection device for selecting from the displayed image a localized region of the sample as a selected location;
a thermal probe operatively coupled to said scanning microscope
a probe positioning routine executing on said computer to cause said thermal probe to be positioned at the selected location;
and
wherein the thermal probe is heated or cooled while substantially simultaneously applying a mechanical stress or strain on the selected location, and measuring the force resulting from the applied stress or strain.

6 more elements

Dependencies are inferred from the claim text.

Facts

Application

09/224,600Filed 31 Dec 1998 · continuation in part

Priority

21 Apr 1997

Granted

13 Mar 2001

Term ends

Not estimatedThe source records don’t support an estimate.

Classification21 codes

G01Q 60/58
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof: sThM [Scanning Thermal Microscopy] or apparatus…
A61B 18/149
Probes or electrodes therefor: bow shaped or with rotatable body at cantilever end, e.g. for resectoscopes, or coagulating rollers
B82Y 35/00
Methods or apparatus for measurement or analysis of nanostructures
G01N 3/60
Investigating strength properties of solid materials by application of mechanical stress: investigating resistance of materials, e.g. refractory…

Family

Application08/837,547Parent of this continuation-in-part · filed 21 Apr 1997

Application60/070,142Us provisional application · filed 31 Dec 1997

Application09/178,849Parent of this continuation-in-part · filed 26 Oct 1998

US 6,095,679 AParent of this continuation-in-part

US 6,030,383 AParent of this continuation-in-part

US 6,200,022 B1This patent

From the US filing history. Foreign family members aren’t listed.

Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy

Life of this patent

Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy

Life of this patent

Abstract

Claims20