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US 6,199,289 B1Granted
Device for measuring the thickness and/or unevenness of wadding or non-wovens
AssigneeZellweger Luwa AG
InventorFrançois Baechler
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AssigneeZellweger Luwa AG
InventorFrançois Baechler
Estimating the term…
The invention concerns a device for measuring the thickness and or unevenness of wadding or non-wovens. The device has a guide element (30) for the wadding or non-wovens and a thickness sensor (26, 27, 28) which presses the wadding or non-wovens against the guide element and can move relative to the latter, the position of the sensor providing a measure of the thickness and/or unevenness of the wadding or non-wovens. To achieve a simpler and cheaper design without sacrificing measurement accuracy, an individual sensor is provided with a translation element (31) which converts the deflections of the individual sensor in one direction into a path signal available in another direction. This allows signals corresponding to the deflections of several individual sensors to be added together and applied to a single common path measurement system (32).
Apparatus for measuring the thickness or nonuniformity of waddings or non-wovens, described hereinafter as laps, said apparatus comprising a guide for the lap being measured, a thickness-sensing element which presses said lap against said guide and is movable relative to said guide so that the position of said thickness sensing element represents a measure of the thickness or non-uniformity of the lap, a measuring system, and an elongated flexible transmission element extending along a path having multiple directions, said transmission element being constructed and disposed for the transmission of the movement of the thickness-sensing element to the measuring system in a direction which is at a desired inclination relative to the direction of movement of the thickness-sensing element.
Dependencies are inferred from the claim text.