System for verifying signal timing accuracy on a digital testing device
AssigneeAgilent Technologies, Inc.
InventorsWilliam R. Lawrence, David H. Armstrong
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsWilliam R. Lawrence, David H. Armstrong
Estimating the term…
An apparatus and method are provided for testing component tolerances of a device for testing integrated circuits. The testing device is generally characterized by a plurality of test connectors disposed at a test head, wherein each test connector carries electrical signals for a test channel. Further, each test channel generally corresponds to a circuit board that includes at least one driver and one receiver. In this general type of tester, a system is provided that includes a specialized DUT board that establishes a low impedance electrical connection (i.e., short) between electrical conductors of a first and second test connector. Through this low impedance path, a first driver from a first circuit board is directly connected (i.e., shorted) to a first receiver on a second circuit board. A controller is configured to control the first driver to output an electrical signal at a predetermined time. The preferred embodiment further includes evaluating mechanism designed to detect the signal received at the first receiver, and timing mechanism configured to time the signal delay. Specifically, the timing mechanism is configured to determine the length of time required to propagate the signal from the driver to the receiver. In accordance with the method aspect, the method includes the step of establishing an electrical connection between electrical conductors of a first and second test connector such that a first driver from a first circuit board is electrically connected across a low impedance path to a first receiver on a second circuit board. The method then controls the output of the first driver to drive an edge of an electrical signal at a predetermined time and detecting the signal received at the first receiver. Finally, the method determines whether the signal received at the first receiver is within a predetermined time period of the predetermined signal level output from the first driver.
An apparatus for testing component tolerance of a device for testing integrated circuits, the device having a plurality of test connectors disposed at a test head, each test connector having electrical conductors carrying electrical signals for a test channel, wherein each test channel corresponds to a circuit board that includes at least one driver and one receiver, the system comprising:
In a testing device for testing integrated circuits having a plurality of test connectors disposed at a test head, each test connector having electrical conductors carrying electrical signals for a test channel, wherein each test channel corresponds to a circuit board that includes at least one driver and one receiver, a method for diagnosing component timing variances comprising the steps of:
In a testing device for testing integrated circuits having a plurality of test connectors disposed at a test head, each test connector having electrical conductors carrying electrical signals for a test channel, wherein each test channel corresponds to a circuit board that includes at least one driver and one receiver, a method for diagnosing component variances comprising the steps of:
A computer readable storage medium containing program code for controlling the operation of a self test for an automatic testing device, comprising:
In a testing device for testing integrated circuits having a plurality of test connectors disposed at a test head, each test connector having electrical conductors carrying electrical signals for a test channel, wherein each test channel corresponds to a circuit board that includes at least one driver and one receiver, a method for diagnosing component variances comprising the steps of:
An apparatus for testing component tolerance of a device for testing integrated circuits, the device having a plurality of test connectors disposed at a test head, each test connector having electrical conductors carrying electrical signals for a test channel, wherein each test channel corresponds to a circuit board that includes at least one driver and one receiver, the system comprising:
Dependencies are inferred from the claim text.