Apparatus and method for analyzing circuit test results and recording medium storing analytical program therefor
AssigneeNEC Corporation
InventorMasaaki Sugimoto
Life of this patent
Estimating the term…
Abstract
An intelligence data base 23 stores interconnection information and position information on the basis of a substrate about a decoder for an LSI memory cell and memory cells and further stores a program for judging whether the memory cell regarded as defective by a electric testing device 22 is really defective. A defect data separating computer 21 refers to the intelligence data base 23 about whether the memory cell regarded as defective by the electric testing device 22 is really defective. On this occasion, the intelligence data base 23 judges whether the memory cell in concern is truly defective and subsequently designates the memory cell's as position on the substrate according to the position information.
Claims14
A circuit test result analyzing apparatus for differentiating between a defect causing circuit and a pseudo-defect causing circuit, based upon test results, obtained for a tested circuit comprising a primary circuit and a secondary circuit group, the secondary circuit group comprising a plurality of secondary circuits each being adapted to cause a defective function under the influence of the primary circuit, the apparatus comprising:
- a data base device, that holds, as information in a combination form between the primary circuit and the secondary circuit group, a substrate position information about the primary circuit and the secondary circuit group wherein each are disposed on a substrate, and an interconnection information between the primary circuit and the secondary circuit group, said data base device determining that the primary circuit causes a first defect resulting in a first defect data when all of the plurality of secondary circuits function in the same defective manner, and that a specific secondary circuit causes a second defect resulting in a second defect data when the specific secondary circuit functions more defectively than any other of the plurality of secondary circuits;
- and
- a defect data separating device for utilizing the first and second defect data so as to identify each of the primary circuit and at least some of the plurality of secondary circuits as one of the defect causing circuit and the pseudo-defect causing circuit.
A method of analyzing circuit test results for differentiating between a defect causing circuit and a pseudo-defect causing circuit, based upon test results obtained for a tested circuit comprising a primary circuit and a secondary circuit group, the secondary circuit group comprising a plurality of secondary circuits each being adapted to cause a defective function under the influence of the primary circuit, the method comprising the steps of:
- storing, as information in a combination form between the primary circuit and the secondary circuit group, a substrate position information about the primary circuit and the secondary circuit group wherein each are disposed on a substrate, and an interconnection information between the primary circuit and the secondary circuit group;
- judging that the primary circuit causes a first defect resulting in a first defect data when all of the plurality of secondary circuits function in the same defective manner, and that a specific secondary circuit causes a second defect resulting in a second defect data when the specific secondary circuit functions more defectively than any other of the plurality of secondary circuits;
- and
- separating a plurality of defect data by utilizing the first and second defect data so as to identify each of the primary circuit and at least some of the plurality of secondary circuits as one of the defect causing circuit and the pseudo-defect causing circuit.
A recording medium that stores an analytical program of test results for differentiating between a defect causing circuit and a pseudo-defect causing circuit, based upon test results obtained for a tested circuit comprising a primary circuit and a secondary circuit group, the secondary circuit group comprising a plurality of secondary circuits each being adapted to cause a defective function under the influence of the primary circuit, the recording medium storing the analytical program and readable by a computer for causing said computer to carry out the steps of:
- storing in said computer, as information in a combination form between the primary circuit and the secondary circuit group, a substrate position information about the primary circuit and the secondary circuit group wherein each are disposed on a substrate, and an interconnection information between the primary circuit and the secondary circuit group,
- determining that the primary circuit causes a first defect resulting in a first defect data when all of the plurality of secondary circuits function in the same defective manner, and that a specific secondary circuit causes a second defect resulting in a second defect data when the specific secondary circuit functions more defectively than any other of the plurality of secondary circuits;
- and
- separating a plurality of defect data by utilizing the first and second defect data so as to identify each of the primary circuit and at least some of the plurality of secondary circuits as one of the defect causing circuit and the pseudo-defect causing circuit.
Dependencies are inferred from the claim text.