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US 6,191,571 B1Granted
Measuring method by spectrum analyzer
AssigneeAdvantest Corporation
InventorsTakayoshi Fukui, Kouichi Yamashita, Takahiro Yamaguchi, Osamu Aoyama, Takashi Kosuge, Yoshiaki Miyamae, Toshiharu Kasahara, Hiroaki Takaoku
Life of this patent
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Abstract
A measuring device and method use a spectrum analyzer. The spectrum analyzer comprises a display screen controlled by a processor on which a spectrum of an input signal is displayed in a frequency region on a half portion of the display screen and a noise level at a frequency associated with the input signal is displayed in a time region on another half portion of the display screen.
Claims2
A measuring device using a spectrum analyzer comprising:
- a display screen controlled by a processor on which a spectrum of an input signal is displayed in a frequency region on a half portion of said display screen and a noise level at a frequency associated with said input signal is displayed in a time region on another half portion of said display screen, wherein said processor alternately obtains a mean carrier value LC of a carrier wave portion of the input signal in said spectrum and a mean noise value LN of data in said time region display, and calculates a C/N value based on LC/LN.
A measuring device using a spectrum analyzer comprising:
- a display screen controlled by a processor on which a spectrum of an input signal is displayed in a frequency region on a half portion of said display screen and a noise level at a frequency associated with said input signal is displayed in a time region on another half portion of said display screen, wherein said processor alternately obtains a first mean value from data of a signal portion in said spectrum display and then obtains a signal level LS assuming that the first mean value is uniformly distributed throughout a band of the signal portion, on one hand, and obtains a second mean value from data in said time region display and then obtains a noise level LN assuming that the second mean value is uniformly distributed throughout a band of a noise portion in said input signal, on the other hand, and calculates an S/N value based on LS/LN.
Dependencies are inferred from the claim text.