Semiconductor device measuring socket having socket position adjustment member

A semiconductor device measuring socket comprising:

• a wiring pattern board on which a test circuit is formed;
• a substantially S-shaped contact for electrically connecting said wiring pattern board to external leads arrayed on a semiconductor device;
• a supporting member for elastically supporting said contact in a tiltable condition;
• a socket main body for storing said contact and said supporting member and for mounting said wiring pattern board on a lower portion of said socket main body;
• and
• at least one planar adjusting member for adjusting a tilting amount of said contact with respect to said socket main body, said planar adjustment means being disposed between said socket main body and said wiring pattern board
• wherein, when said wiring pattern board is mounted on said socket main body, a lower end portion of said contact which is projected from the lower surface of said socket main body is depressed by said wiring pattern board to thereby tilt said contact, whereby a contact position between said external lead and said contact is determined.