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US 6,191,028 B1Granted
Method of patterning dielectric
AssigneeUnited Microelectronics Corp.
InventorsYimin Huang, Tri-Rung Yew
Life of this patent
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Abstract
A method of patterning a dielectric layer. On a substrate having a metal wiring layer formed thereon, a dielectric layer and a masking layer are formed. A cap insulation layer is formed on the masking layer before patterning the dielectric layer. In addition, a dual damasecence process is used for patterning the dielectric layer.
Claims13
A method of patterning a dielectric layer, wherein a substrate having a metal wiring layer formed thereon is provided, comprising:
- forming a first dielectric layer on the metal wiring layer;
- forming a first masking layer on the first dielectric layer, and a first cap insulation layer on the first masking layer;
- forming a first opening aligned with the metal wiring layer by etching the first cap insulation layer, so that the underlying first masking layer is exposed;
- etching the exposed first masking layer to expose the first dielectric layer;
- forming a second dielectric layer, a second masking layer and a second cap insulation over the substrate in sequence;
- forming a second opening by etching the second cap insulation, so that the second masking layer is open within the second opening;
- etching the exposed second masking layer and the underlying second dielectric layer, and etching the first dielectric layer by using the second cap insulation layer as a mask until the metal wiring layer is exposed;
- and
- forming a conductive layer over the substrate.
6 more elements
Dependencies are inferred from the claim text.