US 6,190,911 B1Granted

Semiconductor device and fabrication method thereof

AssigneeCanon Kabushiki Kaisha

InventorIhachiro Gofuku

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Abstract

A method for fabricating a semiconductor device having a wiring part connected via an opening portion formed in an insulting film on a semiconductor region to the semiconductor region. The wiring part includes a polycrystalline semiconductor layer and a metal or metal silicide on the semiconductor layer. A polycrystalline semiconductor layer is deposited over the opening portion of the semiconductor region. First and second impurities are respectively ion injected into the polycrystalline semiconductor layer, wherein the ion injecting range of the first impurities is longer than that of the second impurities, thereby forming a high concentration region at least on a surface side of the polycrystalline semiconductor layer. Following the ion injection of the first and second impurities, a heat treatment is conducted to grow crystals of the polycrystalline semiconductor layer. After the heat treatment, a metal or a metal silicide is deposited on the polycrystalline layer using a low melting point method.

Claims7

Dependent claims

A method for fabricating a semiconductor devise having a wiring part connected, via an opening portion formed in an insulating film on a semiconductor region, to said semiconductor region, wherein said wiring part comprises a polycrystalline semiconductor layer and a metal or metal silicide on said polycrystalline semiconductor layer, comprising the steps, in forming said wiring part, of:

depositing a first layer of polycrystalline semiconductor over said opening portion of said semiconductor region, said first layer having a surface side opposite to a side facing said opening portion and further having first grains;
injecting as a first impurity an ion selected from a group consisting of Ge, Sn, P, As, Sb, Ga and In in a manner of an ion-implantation into said first layer so as to amount to more than 5×1019 atoms/cm3 to convert at least a part of the polycrystalline semiconductor of said first layer at said surface side into an amorphous state;
injecting, into the first layer of said polycrystalline semiconductor, second impurities which have a projection range shorter than that of the first impurities, and which operate as p-type or n-type impurities having a lower mass or lower energy than that of an element of the first impurities, so that a desired region with a high concentration of p-type or n-type impurities is formed, at said surface, wherein the total concentration of impurities is greater than 5×1019 atoms/cm3 at a depth of 1000 Å from the surface of said semiconductor layer;
conducting heat treatment, after the injection of said impurities, whereby the size of the crystal of said first layer at the side wherein at least said metal or metal silicide is brought into contact and located is made larger than the size of said polycrystalline semiconductor layer before said introduction of the impurity;
and
depositing the metal or metal silicide containing a low-melting metal on the region having the second impurity in the more enlarged grains on said polycrystalline semiconductor layer so as to use the region as a contact portion after the heat treatment.

3 more elements

A method for fabricating a semiconductor device comprising a wiring part, connected via an opening portion formed in an insulating film on a semiconductor region, to said semiconductor region, wherein said wiring part comprises a polycrystalline semiconductor layer and metal or metal silicide on the polycrystalline semiconductor layer, comprising the steps, in forming said wiring part, of:

depositing a first layer of a polycrystalline semiconductor over said opening portion on said semiconductor region, said first layer having a surface side opposite to a side facing said opening portion and further having first crystals;
injecting high-energy phosphorus ions as a first impurity, operating as an n-type impurity, and at least one kind of ion selected from a group consisting of phosphorus ions having an energy lower than said phosphorus ion as the first impurity and ions of As, Sb and Bi as a second impurity, respectively in that order, into said first layer, in an injection process wherein the ion projection range of the first impurity is longer than that of the second impurity and the concentration of the first impurity amounts to more than 5×1019 atoms/cm3, whereby at least a part of the first layer is amorphized to form a high impurity concentration region on at least the surface side of said first layer, wherein the total concentration of impurities is greater than 5×1019 atoms/cm3 at a depth of 1000 Å from the surface of said first layer;
conducting heat treatment, after the injection of the impurities, whereby the amorphized part is recrystallized at the side in which at least the said metal or metal silicide is established, to grow the crystal of said first layer larger than the size of the crystal of said polycrystalline semiconductor layer at the stage before introducing the impurity;
and
depositing metal or metal silicide including a low metaling point metal on a region which functions as a contact region and in which the crystal size was made larger after the heat treatment.

2 more elements

Dependencies are inferred from the claim text.

Facts

Application: 08/670,148Filed 27 Jun 1996 · continuation
Priority: JP 5-08107617 Mar 1993
Granted: 20 Feb 2001
Term ends: Not estimatedThe source records don’t support an estimate.

Classification7 codes

H10D 44/041
Manufacture or treatment: having insulated gates
H10D 10/051
Manufacture or treatment: of vertical BJTs
H10D 64/0113
To Group IV semiconductors: the conductive layers comprising highly doped semiconductor materials, e.g. polysilicon layers or amorphous silicon layers
H10P 30/40
Ion implantation into wafers, substrates or parts of devices: into insulating materials