Process for fabricating two different types of wafers in a semiconductor wafer production line
AssigneeHitachi, Ltd.
InventorAtsuyoshi Koike
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi, Ltd.
InventorAtsuyoshi Koike
Estimating the term…
A semiconductor integrated circuit device fabrication method has a main processing line and a sub-processing line. The main processing line includes a plurality of main batch processing sections, each of which processes a plurality of main objects at a time, and a plurality of main sequential processing sections, each of which processes a minimum number of main objects at a time. The main processing line feeds the main objects to the main batch processing sections and the main sequential processing sections for predetermined processing. The sub-processing line includes a plurality of sub-processing sections, each of which performs processing identical with that of a corresponding main batch processing section on a minimum number of sub-objects and certain of the main sequential processing sections. The sub-processing line feeds the sub-objects to the sub-processing sections and the main sequential processing sections for predetermined processing.
A method of fabricating two different types of semiconductor integrated circuit devices in a production line comprising the steps of:
Dependencies are inferred from the claim text.