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US 6,189,115 B1Granted
Boundary scan input output serializer (BIOS) circuit
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
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Abstract
A boundary scan testing circuit includes a boundary scan input and output serializer (BIOS) circuit that more efficiently inputs test patterns to or outputs test patterns from the boundary of sequential or combinational circuits during a single 1149.1 data register scan operation. The circuit includes a programmable controller, at least one shift register section and at least one counter connection between the shift register section and the controller.
Claims7
A circuit comprising:
- A. a programmable input/output controller having a test control output bus and having plural counter input and output leads;
- B. at least one shift register section connected in series between a boundary scan test data input lead and a boundary scan test data output lead;
- and
- C. at least one counter connected between the at least one shift register section and the counter input and output leads of the programmable input/output controller.
1 more element
Dependencies are inferred from the claim text.