Fast technique for converting temperature readings into values expressed in an engineering unit format

A system for converting a temperature reading into a value expressed in an engineering unit format, said system comprising:

• a thermocouple measurement set-up providing a first voltage reading which is indicative of said temperature reading, and a second voltage reading which is indicative of a reference temperature;
• an analog-to-digital converter for converting said first voltage reading into a first digital value, and converting said second voltage reading into a second digital value;
• at least one memory device for storing a plurality of first coefficients, a plurality of second coefficients, and a plurality of reference coefficients;
• a sequencer for enabling fetching of a first coefficient, a second coefficient, and a reference coefficient from said plurality of first coefficients, said plurality of second coefficients, and said plurality of reference coefficients stored in said at least one memory device;
• a first adder for subtracting said fetched reference coefficient from said first digital value, thereby producing a third digital value having low order bits and high order bits;
• a multiplier for multiplying a number identified by said low order bits and said fetched first coefficient, thereby producing a product;
• and
• a second adder for adding said product to said fetched second coefficient, thereby producing said value expressed in an engineering unit format;
• wherein said second digital value is used to address said at least one memory device when said sequencer fetches said reference coefficient, and said high order bits are used to address said at least one memory device when said sequencer fetches said first coefficient and said second coefficient.

A method of compensating for thermoelectric effects of an intermediate wiring junction when converting a temperature reading into a value expressed in an engineering unit format, said method comprising:

• acquiring a reference temperature, said reference temperature being indicative of a temperature of said intermediate wiring junction;
• converting said temperature reading into a first digital value, and converting said reference temperature into a second digital value;
• using said second digital value to address a reference coefficient stored in a memory;
• subtracting said reference coefficient from said first digital value, thereby producing a third digital value;
• splitting said third digital value into low order bits and high order bits;
• using said high order bits to address first and second coefficients stored in said memory;
• multiplying a number identified by said low order bits and said first coefficient, thereby producing a product;
• and
• adding said product to said second coefficient, thereby producing said value expressed in an engineering unit format.