Electrically erasable and programmable nonvolatile semiconductor memory device having data holding function and data holding method
AssigneeKabushiki Kaisha Toshiba
InventorsKazuhiko Kakizoe, Toru Okawa
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AssigneeKabushiki Kaisha Toshiba
InventorsKazuhiko Kakizoe, Toru Okawa
Estimating the term…
Data of a memory cell in a cell array is read out by a readout circuit by use of a word line potential which is the same as that at the program verify time. After the end of the readout operation, data of the same memory cell is read out by the readout circuit by use of a word line potential (refresh verify potential) which is lower than the word line potential at the program verify time and higher than the word line potential at the read time. Then, data read out by use of the word line potential which is the same as that at the program verify time is compared with data read out by use of the word line potential which is set at the refresh verify potential and whether or not the additional write operation for holding data is effected for the memory cell is determined according to the result of comparison.
A nonvolatile semiconductor memory device comprising:
A nonvolatile semiconductor memory device comprising:
A data holding method of a nonvolatile semiconductor memory device, for holding data stored in nonvolatile memory cells comprising:
A data readout method of a nonvolatile semiconductor memory device having a data holding method for holding data stored in nonvolatile memory cells, comprising the steps of:
A storage medium on which a data holding program for holding data stored in memory cells constructing a nonvolatile semiconductor memory device and which can be read by a computer, the data holding program comprising:
Dependencies are inferred from the claim text.