Demodulator tuned by use of a test signal
AssigneeTelefonaktiebolaget LM Ericsson (publ)
InventorsSven Mattisson, Jacobus Haartsen
Life of this patent
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Abstract
A demodulator circuit for demodulating a frequency modulated input signal includes a filter (12) for receiving an incoming input signal and for providing a filtered output signal, a detector (16) for receiving the filtered output signal, and for producing a demodulated output signal therefrom, a tuning circuit (18, 20) which is operable to introduce a test signal into the demodulator circuit in the absence of an incoming input signal, and to vary the frequency response characteristics of at least one of the filter and detector in response to the test signal.
Claims8
A demodulator circuit for demodulating a frequency modulated time division multiplexed input signal, the circuit comprising:
- filter means for receiving an incoming time division multiplexed input signal and for providing a filtered output signal;
- detector means for receiving the filtered output signal, and for producing a demodulated output signal therefrom;
- tuning means which are operable to introduce a test signal into the demodulator circuit during vacant time slots of the time division multiplexed input signal, and to vary the frequency response characteristics of at least one of the filter means and detector means in response to the test signal during the said vacant time slots of the time division multiplexed input signal.
A method of operating a demodulator circuit for use in demodulating an incoming frequency modulated time division multiplexed input signal, the circuit including filter means and detector means, the method comprising:
- producing a demodulated data output signal from the input signal;
- introducing a test signal to the filter means during vacant time slots of the time division multiplexed input signal;
- adjusting the frequency response characteristics of at least one of the filter means and detector means of the demodulator circuit in response to the introduction of the test signal, during the said vacant time slots of the time division multiplexed input signal.
Dependencies are inferred from the claim text.