Positive photoresist compositions and multilayer resist materials using same
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsKen Miyagi, Kousuke Doi, Atsuko Hirata, Hidekatsu Kohara, Toshimasa Nakayama
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsKen Miyagi, Kousuke Doi, Atsuko Hirata, Hidekatsu Kohara, Toshimasa Nakayama
Estimating the term…
In a positive photoresist composition including (A) an alkali-soluble novolak resin and (B) a naphthoquinonediazide ester, the alkali-soluble novolak resin is obtained synthetically by condensation of phenol compounds and an aldehyde or ketone, and the phenol compounds include, for example, 1% to 20% by mole of hydroquinone, 30% to 95% by mole of m-cresol and 2% to 50% by mole of 2,5-xylenol. Thus, a high-definition positive photoresist composition can be obtained, which inhibits the formation of scum, and is satisfactory in sensitivity, sectional shape, focal depth range and other properties even in a process for the formation of an ultrafine resist pattern of 0.30 μm or below by lithography using i-ray.
A positive photoresist composition comprising:
A positive photoresist composition comprising:
A positive photoresist composition comprising:
Dependencies are inferred from the claim text.