Method of preventing junction leakage in field emission displays
AssigneeMicron Technology, Inc.
InventorsDavid A. Cathey, Jr., John Lee
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AssigneeMicron Technology, Inc.
InventorsDavid A. Cathey, Jr., John Lee
Estimating the term…
A method for fabricating a field emission display (FED) with improved junction leakage characteristics is provided. The method includes the formation of a light blocking element between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED. The light blocking element protects the junctions from light formed at the display screen and light generated in the environment striking the junctions. Electrical characteristics of the junctions thus remain constant and junction leakage is improved. The light blocking element may be formed as an opaque light absorbing or light reflecting layer. In addition, the light blocking element may be patterned to protect predetermined areas of the baseplate and may provide other circuit functions such as an interconnect layer.
In a field emission display having a baseplate, emitter sites, semiconductor junctions, and a display screen, a method for constructing said field emission display, said method comprising:
A method for forming a field emission display having protected semiconductor junctions therein, comprising:
A method of forming a field emission display, comprising:
Dependencies are inferred from the claim text.