Loading patent…
AssigneeInternational Business Machines Corporation
InventorsLaura Rohwedder Darden, James John Engel, Peter Anton Habitz, William John Livingstone, Daniel Joseph Mainiero, Jeannie Harrigan Panner, Michael Timothy Trick, Paul Steven Zuchowski
Estimating the term…
A computerized tool or method that calculates the capacitance and resistance of each global wire on the chip, one wire at a time. The invention steps along a track containing a wire segment, grid point by grid point, calculating the resistance and capacitance at that point. At each grid point it searches the neighboring tracks within the surrounding cube for adjacent elements that could cause capacitive effects or affect the resistance of the wire. The method delivers capacitance and resistance values for each process condition for a grid unit length of wire, given the wire type and 3 dimensional environment of the wire segment. The capacitance and resistance at a grid point along the wire are generally determined by one table lookup for wire types based on the surrounding environment. These values are added along wire segments to deliver accurate 3 dimensional capacitances and resistances. The invention can also provide for wires and spaces of various types and widths not provided for in the tables and for calculation of net to net coupling capacitances.
A method of performing capacitance extraction of an integrated circuit comprising the steps of:
A method of performing resistance extraction of an integrated circuit comprising the steps of:
A program storage device readable by machine, tangibly embodying a program of instructions executable by the machine to perform method steps for extraction of parasitic effects on wire segments in an integrated circuit wiring design, said method steps Comprising:
A computerized design system for extracting the parasitic effects on wire segments in an integrated circuit wiring design which comprise:
A method for analyzing capacitance coupling in wiring nets in an integrated circuit comprising the steps of:
Dependencies are inferred from the claim text.