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AssigneePMC-Sierra, Inc.
InventorsAlan Nakamoto, Kris Iniewski, Monika Swic, Curtis Lapadat, Larrie Simon Carr
Estimating the term…
A bus holder for coupling to an integrated circuit bus driven by a plurality of tri-state devices. The bus holder has a bidirectional port and first and second test ports. Logic circuitry coupled between the respective ports is configured such that application of a logic 0 to the first test port causes the bidirectional port to drive whatever logic value is applied to that port; application of a logic 1 to the first test port and application of a logic 0 to the second test port pulls the bidirectional port down to a logic 0; and, application of a logic 1 to both the first and second test ports pulls the bidirectional port up to a logic 1.
A bus holder for detecting stuck-at faults in fault testing of an integrated circuit having a bus driven by a plurality of tri-state devices, said bus holder comprising:
A method of improving detection of stuck-at faults in fault testing of an integrated circuit having a bus driven by a plurality of tri-state devices, said method comprising the steps of:
Dependencies are inferred from the claim text.