Method and apparatus for checking the resistance of programmable elements
AssigneeMicron Technology, Inc.
InventorsDouglas J. Cutter, Adrian E. Ong, Fan Ho, Kurt D. Beigel, Brett M. Debenham, Dien Luong, Kim Pierce, Patrick J. Mullarkey
Life of this patent
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Abstract
Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
Claims27
A method of checking the resistance of a programmable element in an integrated circuit, comprising the steps of:
- producing a first voltage at a first node based on the resistance of a programmable element;
- producing a second voltage at a second node based on a known resistance;
- and
- comparing said first and second voltages and producing an output signal in response to said comparison, the binary value of said output signal indicating whether the resistance of the programmable element is higher or lower than the known resistance.
A method of checking the resistance of a programmable element in an integrated circuit comprising:
- providing a first node at which a first voltage is produced based on the resistance of a programmable element;
- providing a second node at which a second voltage is produced based on a known resistance;
- equilibrating the voltages at the first and second nodes;
- and
- comparing the voltages at the first and second nodes and producing an output signal in response to said comparison, the binary value of said output signal indicating whether the resistance of the programmable element is higher or lower than the known resistance.
Apparatus for checking the resistance of programmable elements in an integrated circuit, comprising:
- circuitry defining a programmable circuit, said circuitry including a programmable element having a resistance and said circuitry including a first node at which a voltage may be developed that is based on the resistance of the programmable element;
- circuitry for producing a reference voltage at a second node, the reference voltage being based on the value of a known resistance;
- and
- circuitry which compares the voltage on the first node to the reference voltage on the second node and which produces an output signal whose binary value indicates whether the value of the resistance of the programmable element is higher or lower than the value of the known resistance.
In an integrated circuit, apparatus comprising:
- a plurality of programmable circuits, each programmable circuit including a programmable element having a resistance and a first node at which a voltage may be developed that is based on the resistance of the programmable element, the first nodes of all said programmable circuits being joined in a common connection;
- selection circuitry for selecting one of said programmable circuits;
- circuitry for producing a reference voltage at a second node, the reference voltage being based on the value of a known resistance;
- and
- circuitry which compares said voltage at the first node of the selected programmable circuit to the reference voltage at the second node and which produces an output signal whose binary value indicates whether the value of the resistance of the programmable element in the selected programmable circuit is higher or lower than the value of the known resistance.
An apparatus for checking the resistance of a programmable element in an integrated circuit, comprising:
- means for producing a first voltage at a first node based on a known resistance;
- means for producing a second voltage at a second node based on the resistance of a programmable element;
- and
- means for comparing the first voltage to the second voltage and producing an output signal in response to said comparison, the binary value of said output signal indicating whether the resistance of the programmable element is higher or lower than the known resistance.
An integrated circuit, comprising:
- a plurality of programmable circuits, each programmable circuit including a programmable element having a resistance and a first node at which a voltage may be developed that is based on the resistance of the programmable element, the first nodes of all programmable circuits being joined in a common connection;
- a decoder for decoding a first address signal and sending a first enabling signal to each of said plurality of programmable circuits;
- a reference circuit for producing a reference voltage at a second node, the reference voltage being based on the value of a known resistance;
- and
- a comparator circuit which compares the voltage at the first node of the selected programmable circuit to the reference voltage at the second node and which produces an output signal whose binary value indicates whether the value of the resistance of the programmable element in the selected programmable circuit is higher or lower than the value of the known resistance.
A semiconductor memory device, comprising:
- a memory array;
- a plurality of programmable circuits, each programmable circuit including a programmable element having a resistance and a first node at which a voltage may be developed that is based on the resistance of the programmable element, the first nodes of all programmable circuits being joined in a common connection;
- means for producing a first voltage at a first node based on a known resistance;
- means for producing a second voltage at a second node based on the resistance of a programmable element;
- and
- means for comparing the first voltage to the second voltage and producing an output signal in response to said comparison, the binary value of said output signal indicating whether the resistance of the programmable element is higher or lower than the known resistance.
Dependencies are inferred from the claim text.