Systems and methods for correcting focal spot thermal drift
AssigneeGeneral Electric Company
InventorsThomas L. Toth, Eugene C. Williams
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Abstract
The present invention, in one form, is a system for correcting thermal drift in an imaging system. More specifically, a correction algorithm determines an adjusted focal spot position based upon a first temperature focal spot position and a second temperature focal spot position. The adjusted focal spot position is utilized in the reconstruction process to correct for focal spot movement resulting from thermal drift.
Claims29
A method for correcting x-ray source focal spot thermal drift in an imaging system, the imaging system including an x-ray source and a detector array having a plurality of detector cells, said method comprising the steps of:
- determining a focal spot position of the x-ray source at temperature T1;
- determining a focal spot position of the x-ray source at temperature T2;
- and
- determining an adjusted focal spot position based on the determined focal spot position of the x-ray source at temperature T1 and the determined focal spot position of the x-ray source at temperature T2.
A thermal drift correction system for an imaging system, the imaging system including an x-ray source producing an x-ray beam and a detector array having a plurality of detector cells, said correction system configured to be coupled to the detector array and to:
- determine a focal spot position of the x-ray source at temperature T1;
- determine a focal spot position of the x-ray source at temperature T2;
- and
- determine an adjusted focal spot position based on the determined focal spot position of the x-ray source at temperature T1 and the determined focal spot position of the x-ray source at temperature T2.
An imaging system comprising an x-ray source having a focal spot, a detector array, and a thermal drift correction system coupled to said detector array, said imaging system configured to:
- determine said focal spot position of said x-ray source at temperature T1;
- determine said focal spot position of said x-ray source at temperature T2;
- and
- determine an adjusted focal spot position based on said focal spot position of said x-ray source at temperature T1 and said focal spot position of said x-ray source at temperature T2.
An imaging system comprising a detector array, an x-ray source having a focal spot and configured to project an x-ray beam toward said detector array, and a computer coupled to said detector array for processing data collected by said detector array, said computer programmed to:
- determine said focal spot position of said x-ray source at temperature T1;
- determine said focal spot position of said x-ray source at temperature T2;
- and
- determine an adjusted focal spot position based on said focal spot position of said x-ray source at temperature T1 and said focal spot position of said x-ray source at temperature T2.
Dependencies are inferred from the claim text.