Circuit and method for enabling semiconductor device burn-in

An integrated circuit memory which has low voltage internal circuitry and a first external pin which receives a first information signal which provides operating information within a predetermined voltage range, comprising:

• a mode detector, coupled to the first external pin, which provides a mode enable signal in response to the first information signal being at a different voltage which is outside the predetermined voltage range;
• and
• a switchable regulator which provides a supply voltage to the low voltage internal circuitry to power the low voltage internal circuitry at a regulated voltage in a normal mode of the integrated circuit memory and at a higher voltage than the regulated voltage in response to the mode enable signal;
• a reference generator coupled to the switchable regulator, and an external pin coupled to the switchable regulator.

An integrated circuit memory which is coupled to first and second power supply terminals and which has low voltage internal circuitry, a normal mode, a burn-in mode, and a first external pin, comprising:

• a first isolation device having a first terminal coupled to the first external pin, and a second terminal;
• a first transistor having a first current terminal coupled to the second terminal of the isolation device;
• a control terminal coupled to the first power supply terminal, and a second current terminal for providing an output;
• a switchable regulator, responsive to the output of the first transistor, which provides a supply voltage to the low voltage internal circuitry to power the low voltage internal circuitry at a regulated voltage in a normal mode of the integrated circuit memory and at a higher voltage than the regulated voltage in the burn-in mode.