Horizontal transfer test handler

A horizontal transfer test handler for transferring IC devices under test in horizontal directions to and from a test head, comprising:

• a device tray provided on an upper surface of the test handler for carrying a plurality of IC devices to be tested in seats formed on a horizontal plane of the device tray;
• an IC socket mounted on the test head to interface between the IC device under test and an IC tester by establishing electrical connections therebetween;
• a device transfer mechanism for picking, transferring, and placing the IC device under test by moving in horizontal and vertical directions on an upper surface which is a horizontal surface of the test handler;
• a video data acquisition means attached to the device transfer mechanism for acquiring video data indicating an image shown at each location on the upper surface of the test handler over which the device transfer mechanism is moved, the video data acquisition means changing positions in accordance with the movement of the device transfer mechanism;
• a video data controller for processing the acquired video data from the video data acquisition means;
• an input/output means for interfacing between an operator and the test handler to receive input data provided by the operator;
• a controller for controlling an overall operation of the horizontal transfer test handler based on the video data from the video data controller and the input data from the input/output means;
• a device transfer mechanism driver to drive the device transfer mechanism on the basis of instructions from the controller;
• and
• a reference position marker provided on the upper surface of the test handler for providing reference position data in the video data obtained by the video data acquisition means;
• wherein said device transfer mechanism driver drives said device transfer mechanism in X and Y directions on said upper surface of the test handler to acquire the video data of said image on said upper surface including said IC socket so that said controller performs a positional calibration process by comparing data representing a center of said IC socket and said reference position marker to produce a correction factor, and wherein said controller determines whether a size of the IC tray represented by said video data matches tray size data in said input data provided through said input/output means, and determines whether a type of IC device on said device tray represented by said video data matches the IC socket on said test head, and wherein said controller corrects a center position of said IC device by changing a position of said device transfer mechanism based on said correction factor.