Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants
AssigneeMicron Technology, Inc.
InventorsRavi Iyer, Sujit Sharan
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorsRavi Iyer, Sujit Sharan
Estimating the term…
A new process for depositing titanium metal layers via chemical vapor deposition is disclosed. The process provides deposited titanium layers having a high degree of conformality, even in trenches and contact openings having aspect ratios greater than 1:5. The reaction gases for the improved process are titanium tetrachloride and a hydrocarbon gas, which for a preferred embodiment of the process is methane. The reaction is carried out in a plasma environment created by a radio frequency source greater than 10 KHz. The key to obtaining titanium metal as a reaction product, rather than titanium carbide, is to set the plasma sustaining electrical power within a range that will remove just one hydrogen atom from each molecule of the hydrocarbon gas. In a preferred embodiment of the process, highly reactive methyl radicals (CH3—) are formed from methane gas. These radicals attack the titanium-chlorine bonds of the tetrachloride molecule and form chloromethane, which is evacuated from the chamber as it is formed. Titanium metal deposits an a wafer or other substrate that has been heated to a temperature within a preferred range of 200-500° C.
A chemical vapor deposition process for depositing a titanium metal layer on a substrate comprising the steps of:
A chemical vapor deposition process for depositing a titanium metal layer on a semiconductor wafer comprising the steps of:
Dependencies are inferred from the claim text.