Method of dividing a wafer and method of manufacturing a semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsShigeo Sasaki, Shinya Takyu, Keisuke Tokubuchi, Koichi Yazima, Hideo Nakayoshi
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AssigneeKabushiki Kaisha Toshiba
InventorsShigeo Sasaki, Shinya Takyu, Keisuke Tokubuchi, Koichi Yazima, Hideo Nakayoshi
Estimating the term…
Grooves are formed in a surface of a wafer, on which surface semiconductor elements are formed, along dicing lines on the wafer by means of a dicing blade. The grooves are deeper than a thickness of a finished chip. Alternatively, grooves are formed in a surface of a wafer, on which surface semiconductor elements are formed, along chip parting lines on the wafer by etching. Like the grooves described above, the grooves are deeper than a thickness of a finished chip. A holding member is attached on the surface of the wafer on which the semiconductor elements are formed. The bottom surface of the wafer is lapped and polished to the thickness of the finished chip, thereby dividing the wafer into chips. When the wafer is divided into the chips, the lapping and polishing is continued until the thickness of the wafer becomes equal to the thickness of the finished chip, even after the wafer has been divided into the chips by the lapping and polishing.
A wafer dividing method comprising the steps of:
A method of manufacturing a semiconductor device, comprising the steps of:
A wafer dividing method comprising the steps of:
A wafer dividing method comprising the steps of:
A wafer dividing method comprising the steps of:
A wafer dividing method comprising the steps of:
Dependencies are inferred from the claim text.