Process and apparatus for preparation of silicon crystals with reduced metal content
AssigneeMEMC Electronic Materials, Inc.
InventorsJohn D. Holder, Steven M. Joslin, Harold W. Korb
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AssigneeMEMC Electronic Materials, Inc.
InventorsJohn D. Holder, Steven M. Joslin, Harold W. Korb
Estimating the term…
A method and apparatus for producing silicon single crystals with reduced contamination is disclosed. In one embodiment the structural components constructed of graphite and located in the hot zone of the crystal pulling apparatus have two protective layers. The first protective layer is applied directly to the graphite component. The second protective layer is a silicon layer and is applied on top of the first protective layer and covers the first layer. In a second embodiment, the structural components constructed of graphite and located in the hot zone of the crystal pulling apparatus have a single protective layer. The single protective layer is applied directly to the graphite and consists of a mixture of silicon carbide and silicon.
A crystal pulling apparatus for producing a silicon single crystal having a reduced amount of metal contamination grown by the Czochralski process, the apparatus comprising:
A crystal pulling apparatus for producing a silicon single crystal having a reduced amount of metal contamination grown by the Czochralski process, the apparatus comprising:
A process for controlling the contamination of a silicon single crystal ingot with metal associated with a graphite containing component used in a crystal pulling apparatus during the growth of the silicon crystal, the process comprising:
A process for controlling the contamination of a silicon single crystal ingot with metal associated with a graphite containing component used in a crystal pulling apparatus during the growth of the silicon crystal, the process comprising:
A component for use in a silicon single crystal pulling apparatus, the component comprising graphite and having a first protective layer covering the graphite and a second protective layer covering the first protective layer wherein the second protective layer is silicon.
Dependencies are inferred from the claim text.