Schlieren method for imaging semiconductor device properties
AssigneeOptometrix, Inc.
InventorRobert Aaron Falk
Life of this patent
Estimating the term…
Abstract
An optical beam (3) passes through an illuminator (18), a semiconductor device (70), and an imager (20) to form a test object image (17) on a camera (16). Intensity variations in the object image (17) correspond to carrier density and temperature gradients inside the semiconductor device (70).
Claims22
A method for imaging an internal characteristic of a semiconductor circuit device, comprising:
- a) Generating an optical beam with an illuminator, the optical beam having a wavelength selected such that the semiconductor circuit device passes the optical beam without undo absorption;
- b) Radiating the optical beam toward an imager, the semiconductor circuit device being disposed between the illuminator and the imager such that the optical beam passes through the semiconductor circuit device and the internal characteristic of the semiconductor circuit device imposes an angular deviation in the optical beam arriving at the imager, the imager operative to focus the optical beam into an image of the illuminator and another image of the semiconductor circuit device;
- and
- c) Detecting an intensity variation in the image of the semiconductor circuit device, the intensity variation being related to the angular deviation imposed on the optical beam by the internal characteristic of the semiconductor circuit device.
An apparatus for imaging the internal temperature and carrier density in a semiconductor circuit device, comprising:
- a) an imaging system comprising an illuminator for generating an optical beam, an imager for focusing the optical beam, and an image detector for detecting images formed by the optical beam;
- b) the optical beam passing from the illuminator to the imager and having a wavelength selected such that the semiconductor circuit device passes the optical beam without undo absorption while allowing for detection of the optical beam by the image detector, and
- c) the semiconductor circuit device located between the illuminator and the imager in the path of the optical beam such that the changes in the internal temperature and carrier density of the semiconductor circuit device impose a change in the intensity of the optical beam arriving at the image detector.
An apparatus for detecting characteristic of a semiconductor circuit device, the characteristic having a refractive index gradient, the apparatus comprising:
- an illuminator, including an optical source and a first lens, the optical source capable of radiating an optical beam to the first lens, the first lens being positioned a distance from the optical source roughly equal to the focal length of the first lens, the first lens being further configured to collimate the optical beam for transmission along an optical beam path;
- an imager positioned along the optical beam path, the imager including a second lens configured to focus the optical beam to a focal point;
- and
- an image detector positioned at a distance along the optical beam path and beyond the focal point of the second lens, the image detector being capable of detecting intensity variations in the optical beam;
- wherein if the semiconductor circuit device is placed between the illuminator and the imager along the optical beam path, angular deviations in the optical beam caused by the refractive index gradient are transformed into intensity variations in the optical beam and are detected by the image detector.
Dependencies are inferred from the claim text.