Methods for measuring the sorbate content of substrates
AssigneeLpkf Laser & Electronics AG
InventorsJoerg Kickelhain, Olaf Schulz, Frank Imkenberg
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AssigneeLpkf Laser & Electronics AG
InventorsJoerg Kickelhain, Olaf Schulz, Frank Imkenberg
Estimating the term…
The invention relates to methods for measuring the sorbate content in substrates, using a sensor with a measuring chamber. Said chamber contains a support medium whose partial pressure of sorbate is determined in order to determine the sorbate content of the substrate. According to the first method, the temperature of the support medium is varied up to a value at which the partial pressure of sorbate in the measuring chamber no longer varies with the temperature of the support medium, and slightly over this value. This partial pressure of sorbate is then used to determine the sorbate content of the substrate. According to the second method, the temperature of the support medium is kept essentially constant and the speed at which the partial pressure of sorbate of the support medium approaches the stable end value is determined. The sorbate content of the substrate is then determined taking into account the known dependency relationship between said speed and the vapor or solution partial pressure in the substrate. The two methods provide a way of measuring relatively high humidity contents of substrates based on the determination of the equilibrium moisture content.
A method for measuring the sorbate content of a substrate containing a sorbed material, said method comprising the acts of:
A method for measuring the sorbate content of a substrate containing a sorbed material, said method comprising the acts of:
A sensor for measuring the sorbate content of an adjacently disposed substrate containing a sorbed material, said sensor comprising:
Dependencies are inferred from the claim text.