Probe tip locator

A probe tip locator for use in determining the x-axis location and y-axis location of a probe tip of a microscope relative to a locator, said locator comprising:

• a plurality of parallel reference lines, each of said reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of first sets of parallel encoded bit fields, each one of said first sets corresponding to one of said first reference lines;
• and
• a plurality of second sets of parallel encoded bit fields parallel to said first sets, each one of said second sets corresponding to a predetermined y-axis location of said probe tip, such that a scan of a portion of said locator is used to determine the x-axis location and y-axis location of said probe tip relative to said probe tip locator by movement of said probe tip relative to said probe tip locator.

A method of determining the x-axis location and y-axis location of a probe tip of a microscope relative to a probe tip locator comprising the steps of:

• (a) positioning a probe tip over a probe tip locator, said locator having a plurality of first reference lines parallel in a first direction, each of said first reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of sets of parallel encoded bit fields, each set corresponding to one of said first reference lines;
• and a plurality of second reference lines, each one of said second reference lines intersecting at least one of said first reference lines;
• (b) scanning at least one of said first reference lines, one set of said parallel encoded bit fields and at least one of said second reference lines;
• (c) decoding said scanned encoded bits to determine which of said first reference lines was scanned and thereby determining the x-axis location of said probe tip;
• and
• (d) determining the y-axis location of said probe tip by measuring the distance between said scanned first reference line and said scanned second reference line.

A method of determining the x-axis location and y-axis location of a probe tip of a microscope relative to a probe tip locator comprising the steps of:

• (a) positioning a probe tip over a probe tip locator, said locator having a plurality of parallel reference lines, each of said first reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of first sets of parallel encoded bit fields, each one of said first sets corresponding to one of said reference lines;
• and a plurality of second sets of parallel encoded bit fields parallel to said first sets, each one of said second sets corresponding to a predetermined y-axis location of said probe tip;
• (b) scanning at least one of said first reference lines, at least a portion of one of said first sets of parallel encoded bit fields and at least a portion of one of said second sets of parallel encoded bit fields;
• (c) decoding said scanned portion of said first sets of parallel encoded bit fields to determine which of said first reference lines was scanned and thereby determining the x-axis location of said probe tip;
• and
• (d) decoding said scanned portion of said second sets of parallel encoded bit fields to determine the y-axis location of said probe tip.

A system for determining the x-axis location and y-axis location of a probe tip of a microscope relative to a stage coordinate system comprising:

• a probe tip mounted on a microscope;
• a probe tip locator comprising a plurality of first reference lines parallel in a first direction, each of said first reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of sets of parallel encoded bit fields, each one of said sets corresponding to one of said first reference lines;
• and a plurality of second reference lines, each one of said second reference lines intersecting at least one of said first reference lines;
• said locator mounted on a microscope stage, said stage having a stage coordinate system;
• such that a scan of a portion of said locator is used to determine the x-axis location and y-axis location of said probe tip relative to said stage coordinate system.

A system for determining the x-axis location and y-axis location of a probe tip of a microscope relative to a stage coordinate system comprising:

• a probe tip mounted on a microscope;
• a probe tip locator comprising a plurality of parallel reference lines, each of said reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of first sets of parallel encoded bit fields, each one of said first sets corresponding to one of said first reference lines;
• and a plurality of second sets of parallel encoded bit fields parallel to said first sets, each one of said second sets corresponding to a predetermined y-axis location of said probe tip;
• said locator mounted on a microscope stage, said stage having a stage coordinate system;
• such that a scan of a portion of said locator is used to determine the x-axis location and y-axis location of said probe tip relative to said stage coordinate system.

A system for determining the x-axis location and y-axis location of a probe tip of a microscope relative to a scan actuator comprising:

• a probe tip mounted on a microscope, said microscope having a scan actuator;
• a probe tip locator comprising a plurality of first reference lines parallel in a first direction, each of said first reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of sets of parallel encoded bit fields, each one of said sets corresponding to one of said first reference lines;
• and a plurality of second reference lines, each one of said second reference lines intersecting at least one of said first reference lines;
• said locator mounted on a microscope stage;
• such that a scan of a portion of said locator is used to determine the x-axis location and y-axis location of said probe tip relative to said scan actuator.

A system for determining the x-axis location and y-axis location of a probe tip of a microscope relative to a scan actuator comprising:

• a probe tip mounted on a microscope, said microscope having scan actuator;
• a probe tip locator comprising a plurality of parallel reference lines, each of said reference lines representing a predetermined x-axis location of said probe tip;
• a plurality of first sets of parallel encoded bit fields, each one of said first sets corresponding to one of said first reference lines;
• and a plurality of second sets of parallel encoded bit fields parallel to said first sets, each one of said second sets corresponding to a predetermined y-axis location of said probe tip;
• said locator mounted on a microscope stage;
• such that a scan of a portion of said locator is used to determine the x-axis location and y-axis location of said probe tip relative to said scan actuator.