Method for forming metal layer using atomic layer deposition
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-bom Kang, Yun-sook Chae, Chang-soo Park, Sang-in Lee
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-bom Kang, Yun-sook Chae, Chang-soo Park, Sang-in Lee
Estimating the term…
A method for forming a metal layer using an atomic layer deposition process. A sacrificial metal atomic layer is formed on a semiconductor substrate by reacting a precursor containing a metal with a reducing gas, and a metal atomic layer is formed of metal atoms separated from a metal halide gas on a semiconductor substrate by reacting the sacrificial metal atomic layer with a metal halide gas. Also, a silicon atomic layer may be additionally formed on the metal atomic layer using a silicon source gas, to thereby alternately stack metal atomic layers and silicon layers. Thus, a metal layer or a metal silicide layer having excellent step coverage can be formed on the semiconductor substrate.
A method for forming a metal layer, comprising the steps of:
A method for forming a metal silicide layer, comprising the steps of:
Dependencies are inferred from the claim text.