System and method for monitoring and controlling the deposition of pattern and overall material coatings
AssigneeCC1, Inc.
InventorsClarence A. Lewis, James Edward Lewis, Richard Dale Lewis
Life of this patent
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AssigneeCC1, Inc.
InventorsClarence A. Lewis, James Edward Lewis, Richard Dale Lewis
Estimating the term…
Utilizing optical and signal processing techniques a system permitting the continuous monitoring and quality control of pattern and overall coatings applied to web materials is disclosed. Rather than using manual feedback control means to accomplish a uniform and consistent application of pattern or overall material to roll web material, the disclosed system incorporates optical sensing means along with software methodologies that enable the web material to be sampled and characterized over a number of different points. This characterization of the manufacturing process can be used with the disclosed algorithms to implement a quality control feedback mechanism which in turn can automatically correct for changes in manufacturing conditions in realtime. This permits patterns and coatings to be applied consistently without the use of human intervention and with a great reduction in overall material waste and a corresponding increase in overall coating reliability.
A method for monitoring and/or controlling the deposition of pattern and/or overall material coatings comprising the steps of:
A method for monitoring and/or controlling the deposition of pattern and/or overall material coatings comprising the steps of:
A method for monitoring and/or controlling the deposition of pattern and/or overall material coatings comprising the steps of:
Dependencies are inferred from the claim text.