Apparatus and method for testing non-componented printed circuit boards
Assigneeatg test systems GmbH & Co. KG
InventorManfred Prokopp
Life of this patent
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Abstract
A circuit board test apparatus comprising a plurality of circuit board test points is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point of the board under test being in contact with a test connection via an electrical connection. At least two of the electrical connections are electrically connected so that at least two circuit board test points of the board under test are in connection with a sole test connection.
Claims47
A test apparatus for testing printed circuit boards, including an electronic analyzer comprising a plurality of test connections, wherein circuit board test points of a non-componented circuit board under test are in contact with the test connections of the electronic analyzer via electrical connections and at least two of said electrical connections are electrically connected to each other so that at least two circuit board test points of said board under test are in connection with a single test connection of said electronic analyzer wherein said test connections of said electronic analyzer are electrically connected to a grid pattern whereon an adapter and/or translator is mounted, on which a circuit board to be tested is adapted to be placed, said adapter and/or translator producing an electrical contact from the circuit board test points on said circuit board to contact points of said grid pattern, and at least two contact points of said grid pattern being connected to each other electrically.
A test apparatus for testing printed circuit boards, including an electronic analyzer comprising a plurality of test connections, wherein circuit board test points of a non-componented circuit board under test are in contact with the test connections of the electronic analyzer via electrical connections and at least two of said electrical connections are electrically connected to each other so that at least two circuit board test points of said board under test are in connection with a single test connection of said electronic analyzer, wherein said test apparatus comprises a grid pattern of several contact points, two test contacts emanating from at least one contact point, each test contact being contactable with a circuit board test point of said board under test and wherein an adapter is provided arranged on a full grid cassette, said full grid cassette being mounted on said grid pattern of said test apparatus, said test apparatus comprising pads as contact points in a regular arrangement, each pad being connected to an electronic analyzer via a conductor path.
A test apparatus for testing printed circuit boards, including an electronic analyzer comprising a plurality of test connections, wherein circuit board test points of a non-componented circuit board under test are in contact with the test connections of the electronic analyzer via electrical connections and at least two of said electrical connections are electrically connected to each other so that at least two circuit board test points of said board under test are in connection with a single test connection of said electronic analyzer wherein only circuit board test points of circuits of said board under test are electrically connected when they satisfy an adjacency criterion.
A test apparatus for testing printed circuit boards, including an electronic analyzer comprising a plurality of test connections, wherein circuit board test points of a non-componented circuit board under test are in contact with the test connections of the electronic analyzer via electrical connections and at least two of said electrical connections are electrically connected to each other so that at least two circuit board test points of said board under test are in connection with a single test connection of said electronic analyzer wherein for electrically connecting said electrical connections between said test connections and said circuit board test points a linking mask is provided, said linking mask being arranged between an adapter and a grid pattern, said linking mask comprising conductor paths electrically connecting at least two connecting elements to a contact point of said grid pattern.
A test apparatus for testing printed circuit boards, including an electronic analyzer comprising a plurality of test connections, wherein circuit board test points of a non-componented circuit board under test are in contact with the test connections of the electronic analyzer via electrical connections and at least two of said electrical connections are electrically connected to each other so that at least two circuit board test points of said board under test are in connection with a single test connection of said electronic analyzer wherein a translator board is provided, the translator board having a surface, the translator board comprising contact pads on the surface, each assigned to a circuit board test point, and comprising on the opposite surface contact pads, each assigned to a test connection, two of said contact pads assigned to circuit board test points being electrically connected together with a contact pad assigned to a test connection.
A method for testing circuit boards with a test apparatus comprising an adapter, the method comprising:
- determining whether two circuits of a non-componented board under test can form practically no short-circuit by reference to at least one adjacency criterion;
- and
- performing no short-circuit test between the two circuits if the at least one adjacency criterion is satisfied.
Dependencies are inferred from the claim text.