Dynamic random access memory capable of simultaneously writing identical data to memory cells
AssigneeKabushiki Kaisha Toshiba
InventorsShinji Miyano, Toshimasa Namekawa, Masaharu Wada
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AssigneeKabushiki Kaisha Toshiba
InventorsShinji Miyano, Toshimasa Namekawa, Masaharu Wada
Estimating the term…
Where a first bit line pair comprises a first bit line and a second bit line, a first memory cell is located at an intersection between a selected word line and the first bit line. Where a second bit line pair comprises a third bit line and a fourth bit line, a second memory cell is located at an intersection between the selected word line and the fourth bit line. A data line pair comprises a first data line and a second data line. A first column switch comprises a first transistor connected between the first bit line and the first data line and a second transistor connected between the second bit line and the second data line. A second column switch comprises a third transistor connected between the third bit line and the first data line and a fourth transistor connected between the fourth bit line and the second data line. A column decoder turns on one of the first column switch and the second column switch in a normal-write mode, and turns on both the first column switch and the second column switch in a block-write mode. In the block-write mode, a potential of the first bit line and a potential of the fourth bit line are complementary to each other. Identical data is written to the first memory cell and the second memory cell.
A semiconductor memory comprising:
A semiconductor memory comprising:
A semiconductor memory comprising:
Dependencies are inferred from the claim text.