Semiconductor storage device having redundancy circuit
AssigneeNEC Corporation
InventorMasamichi Ogishima
Life of this patent
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Abstract
According to one embodiment, a semiconductor storage device (100) can provide an enhanced rate of defective sub-word line replacement by independently controlling the activation and deactivation of redundancy sub-word lines (Sw(1,0 to Sw(5,2))). Redundancy sub-word lines (Sw(1,0 to Sw(5,2))) can be connected to different redundancy sub-word drivers (114a to 114e). Sub-word selecting circuits (126-1 to 126-4) can generate 2-bit redundancy sub-word selecting signals S11 to S14 from sub-word selecting signals XN and XT and fuse output signals H11-H14 received from a fuse circuit 124. Redundancy sub-word selecting signals S11 to S14 can independently activate and deactivate redundancy sub-word lines (Sw(1,0 to Sw(5,2))) coupled to redundancy sub-word drivers (114a to 114e).
Claims22
A semiconductor storage device with a redundancy circuit, comprising:
- a plurality of memory cells;
- at least one main-word line;
- sub-word lines associated with the at least one-main word line;
- a row redundancy circuit that can replace a defective sub-word line, the row redundancy circuit including redundancy main-word lines, redundancy sub- word lines, redundancy sub-word drivers that drive the redundancy sub-word lines between at least two different potentials according to sub-word selecting signals, and redundancy memory cells;
- redundancy main-word drivers that can drive redundancy main word lines between at least two different potentials;
- and
- a redundancy selection control circuit that controls the row redundancy circuit and independently activates redundancy sub-word lines, the redundancy selection control circuit including a plurality of sub-word selecting circuits that each provide the sub-word selecting signals at a boost voltage, the boost voltage being greater than a power supply voltage for the semiconductor storage device.
A semiconductor storage device with a redundancy circuit, comprising:
- a plurality of sub-banks, each sub-bank including a plurality of input/output (I/O) units having first through mth plates, where m is an integer greater than two, each plate including a plurality of memory cells, main word lines for selecting a plurality of memory cells, sub-word lines that provide a lower level of memory cell selection than main word lines, a row redundancy circuit that includes a plurality of redundancy memory cells, redundancy main word lines, and redundancy sub-word lines;
- a plurality of redundancy main-word drivers for driving the redundancy main-word lines, each redundancy main-word driver including a main plate decoder that receives address values and activates at least one plate of an I/O unit and a redundancy main-word line within the activated plate;
- a redundancy selection control circuit that includes a redundancy plate decoder that receives address values and generates a plate select signal;
- a fuse circuit that receives the plate select signal, a pre-charge signal, and address selecting signals and generates an activating signal when the address selecting signals correspond to an address selecting value determined by programming fuse elements in the fuse circuit;
- and
- at least one sub-word selecting circuit that receives the activating signal and independently controls the activation and deactivation of redundancy sub-word selecting signals, each sub-word selecting signal controlling the activation and deactivation of a redundancy sub-word line.
A memory device, comprising:
- a plurality of memory cells;
- a plurality of main word lines;
- a plurality of sub-word lines coupled to the memory cells;
- a row redundancy circuit including
- a plurality of redundancy memory cells,
- at least one redundancy main word line,
- a plurality of redundancy sub-word lines coupled to the redundancy memory cells, and
- a plurality of redundancy sub-word drivers associated with the redundancy main word line, each redundancy sub-word driver being coupled to at least two redundancy sub-word lines and independently controlling the activation and deactivation of each of its redundancy sub-word lines according to the potential of the associated main word line and a plurality of redundancy sub-word selecting signals;
- and
- a programmable address detection circuit that includes a plurality of programmable elements that can store a plurality of programmed addresses, the programmable address detection circuit receiving a plurality of address values and generating an address match indication signal when address values match a programmed address.
A semiconductor storage device with a redundancy circuit, comprising:
- a redundancy main word line extending in a first direction and having a first point and second point apart from said first point;
- a first redundancy sub-word driver disposed adjacently to said first point and remotely from said second point and connected to said first point, for driving first and second redundancy sub-word lines that extend in said first direction, said first redundancy sub-word driver independently controlling the activation and deactivation of said first and second redundancy sub-word lines according to a first redundancy sub-word selecting signal;
- a second redundancy sub-word driver disposed adjacently to said second point and remotely from said first point and connected to said second point, for driving redundancy third and fourth sub-word lines that extend in said first direction, said second redundancy sub-word driver independently controlling the activation and deactivation of said third and fourth redundancy sub-word lines according to a second redundancy sub-word selecting signal which is different from said first redundancy sub-word selecting signal;
- and
- a redundancy selection control circuit activating one of said first and second redundancy sub-word selecting signals and deactivating the other of said first and second redundancy sub-word selecting signals.
Dependencies are inferred from the claim text.