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US 6,153,524 AGranted
Cluster tool method using plasma immersion ion implantation
AssigneeSilicon Genesis Corporation
InventorsFrancois J. Henley, Nathan Cheung
Life of this patent
Estimating the term…
Abstract
A cluster tool method using plasma immersion ion implantation chamber. In some embodiments, the cluster tool method also includes a controlled cleaving process chamber, as well as others.
Claims73
A cluster tool process for forming a silicon-on-insulator substrate, said process comprising steps of:
- providing a donor substrate;
- placing said donor substrate in a first chamber and introducing particles through a surface of said donor substrate to a predetermined selected depth underneath said surface, said particles being at a concentration at said selected depth to define a portion of donor substrate material to be removed above said selected depth;
- placing said donor substrate in a second chamber and joining said donor substrate to a target substrate, said surface of said donor substrate facing a face of said target substrate to form a multi-layered substrate;
- and
- placing said multi-layered substrate in a third chamber, and providing energy to a selected region of said substrate to initiate a controlled cleaving action at said selected depth in said substrate, wherein said cleaving action propagates a cleave front to free said portion of donor substrate material from said substrate.
2 more elements
Dependencies are inferred from the claim text.